HIOKI ST5680 DC HIPOT TESTER

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DC Hipot Test Cihazı ST5680, test edilen nesneye yüksek voltaj uygulayarak bir dalga formuyla güvenilir yalıtımı test eder. Cihaz, test konumları arasına bir DC gerilimi uygular ve yalıtım performansını belirlemek için kaçak akımı ölçer.

– Dalga biçimini kullanarak pil güvenliğini ve yalıtım performansını doğrulayın.
– DC dayanım gerilimi testi için özel olarak tasarlanmış yüksek özellikli model. Bir dizi teslimat denetimi desteğiyle.
– Arızalı pillerin nakliyesini önlemek için ark algılama ve temas kontrolü işlevlerine sahiptir.

Key Features

Yangına yol açabilecek gizli kusurları olan pillerin nakliyesini önleme
Üretim süreçlerini iyileştirmek, arızalı pilleri analiz etmek ve denetim kalitesini artırmak için dalga biçimleri ve değerlerle yalıtım performansını doğrulayın
Ark deşarjlarından kaynaklanan küçük arızaları önleyin
Hatalı kararlar nedeniyle test tekrarlarını önleme
Uluslararası standartlar tarafından tanımlanan test koşullarını karşılar
Yalıtım kırılma gerilimi (BDV) ölçüm fonksiyonu

Basic Specifications

Accuracy guaranteed: 1 year

Main functions	DC Hipot test, Insulation resistance test, Breakdown voltage test, Waveform display functionality, Arc discharge detection, Contact check function See “Various Tests and Functionality” table for details
List of other features	Interlock, GFI, Auto discharge, Offset cancellation, Set voltage modification during testing, Momentary out, Command monitor, I/O handler test, Key lock, Self-check, Calibration deadline check, EXT SW (Remote control)
Operating temperature and humidity range	0°C to 40°C (32°F to 104°F), 80% RH or less (non-condensing)
Standards	Safety: IEC 61010 EMC: IEC 61326 Class A
Power supply	100 to 240 V AC
Power consumption	Approx. 180 VA Power supply conditions are 220 V power supply voltage, 50 Hz/60 Hz power supply frequency, DC withstand voltage test mode, 2.5 kV test voltage, and 5 mA load current (500 kΩ load resistance).
Maximum rated power	800 VA
Interface	Communications: USB, LAN, EXT I/O Options: RS-232C (Z3001), GP-IB (Z3000) Memory: USB drive
Dimensions and mass	Approx. 305 mm (12.01 in) W × 142 mm (5.59 in) H × 430 mm (16.93 in) D (excluding protruding parts), Approx. 10 kg (352.7 oz)
Included accessories	Power cord ×1, CD ×1 (PDF: Instruction Manual, Communication Instruction Manual), EXT I/O male connector ×1, EXT I/O connector cover ×1, Custom-made interlock-canceling connector for the EXT I/O ×1, Startup Guide ×1

Various Tests and Functionality

DC Hipot test	Output voltage: DC 0.010 kV to 8.000 kV (1 V resolution) Load regulation: ±1% or less Output setting accuracy: ± (1.2% of setting + 20 V) Output current/cutoff current: Max. 100 mA Current accuracy: > 3.00 mA: ±(1.5% rdg. + 2 μA) ≤ 3.00 mA: ±1.5% rdg. Maximum resolution: 0.001 μA Test time: 0.1 s to 999 s, continuous (timer off) Voltage ramp up / ramp down time: 0.1 s to 300 s / 0.1 s to 300 s, off Short-circuit current: 200 mA or less Test modes: W to IR, IR to W, program test
Insulation resistance test	Output voltage: 10 V DC to 2000 V (1 V resolution) Output setting accuracy: ± (1.2% of setting + 2 V) Resistance value display range: 10.00 kΩ to 200.0 GΩ (0.01 kΩ resolution) Accuracy guarantee range: 10.00 kΩ to 99.99 GΩ Resistance accuracy: ±(1.5% rdg. + 3 dgt.) See “Insulation resistance measurement accuracy” table for details Test time: 0.1 s to 999 s, continuous (timer off) Voltage rise/fall time: 0.1 s to 300 s / 0.1 s to 300 s, off
Breakdown voltage test	Test method: Continuous voltage rise test, stepped voltage rise test Measurement: Insulation breakdown voltage (kV), insulation breakdown strength (kV/mm) Settings: Start voltage, end voltage, rise speed, arc detection, electrode distance, upper limit current
Waveform display functionality	Waveform display: Voltage, current, insulation resistance Sampling rate: 500 kS/s Resolution: 256 K words
Arc discharge detection	Detection method: Monitoring of fluctuations in the test voltage Settings: Test voltage variability 1% to 50%
Contact check functionality	Detection method: Capacitance measurement method Settings: Threshold (capacitance) setting 1.0 nF to 100.0 nF
Memory functionality	– Saving of waveforms/graphs: Save to USB memory Save formats: BMP, PNG, CSV – Panel memory function: Saves test condition settings internally in the instrument DC withstand voltage testing/insulation resistance testing: Up to 64 sets of settings each Program testing: Up to 30 programs (max. 50 steps) Insulation breakdown voltage testing: Up to 10 sets of settings – Data memory function Saves measured values in the instrument’s internal memory (up to 32,000 values)
Judgment functionality (Judgment output)	PASS judgment, FAIL judgment (UPPER FAIL, LOWER FAIL) UPPER_FAIL : Measured value > upper limit value PASS : Upper limit value ≥ measured value ≥ lower limit value LOWER_FAIL : Measured value < lower limit value

Insulation Resistance Measurement Accuracy

Accuracy guaranteed test voltage range: 50 V to 2000 V

Measurement range	10 kΩ to 99.99 GΩ (*1)
10 nA ≤ I ≤ 3 μA	100 MΩ ～ 999.9 MΩ 1.00 GΩ ～ 99.99 GΩ	± (20% rdg.) 2, 3, *4
100 nA ≤ I ≤ 30 μA	10.00 MΩ ～ 99.99 MΩ 100.0 MΩ ～ 999.9 MΩ	± (5% rdg.) 2, 3, *4
1 μA ≤ I ≤ 300 μA	1.000 MΩ ～ 9.999 MΩ 10.00 MΩ ～ 99.99 MΩ	± (2% rdg. + 5 dgt.) 2, 3, *4
10 μA ≤ I ≤ 3 mA	100.0 kΩ ～ 999.9 kΩ 1.000 MΩ ～ 9.999 MΩ	± (1.5% rdg. +3 dgt.) 2, 3, *4
100 μA ≤ I ≤ 30 mA	10.00 kΩ ～ 99.99 kΩ 100.0 kΩ ～ 999.9 kΩ	± (1.5% rdg. +3 dgt.) 2, 3, *4
1 mA ≤ I ≤ 100 mA	10.00 kΩ ～ 99.99 kΩ	± (1.5% rdg. +3 dgt.) 2, 3, *4

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